DA400S磁粉探伤仪

美国派克便携式：
    美国PARKER公司磁粉探伤仪DA-400采用了许多*进技术来形成感应磁场，具有*通用性，固定的AC或DC磁场，用于表面和近表面缺陷的检测，是控制器与固态电子器件为一体的高性能的轻便仪。可疳高能磁场集中施加到检测区，快速准确发现材料缺陷。磁极可将AC或DC磁场施加到各种形状工件的检测区域，没有电弧烧伤。

的技术参数：

DA-400 Series Contour Probes^®

The DA-400 Contour Probe is a portable, self-contained instrument designed to produce a magnetic field on or within ferro-magnetic materials.

The selective AC and pulsed DC functions are built into a single reliable instrument. The AC mode produces an intense AC field for detection of surface defects and demagnetizing after inspection. The DC mode produces an intense pulsed DC field for detection of some subsurface defects.

Controls and solid-state electronics are contained within the high impact molded housing. Articulating legs allow the AC or DC field to be applied to the precise area of inspection on nearly any part of the surface shape... in the lab, factory or field site.

All Parker Contour Probes comply with the requirements of applicable specifications. Certified for European CE requirements.

• Versatility and powerful performance in a lightweight （8 lbs.） instrument
• Constant AC or pulsed DC fields with the flip of a switch for the location of surface and some sub-surface defects
• Apply continuous or residual magnetic fields and demagnetize too
• Use with dry powder, wet fluorescent or visible
• High impact molded housing
• One year repair/replacement guarantee

DA-400s Series Contour Probes^® SPECIFICATIONS